java.lang.Object
eu.hansolo.fx.charts.wafermap.KLA
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Constructor Summary
Constructors -
Method Summary
Modifier and TypeMethodDescriptionvoiddoubledoubledoubledoubledoubledoublegetDies()intintintgetId()intgetLotID()intintintintdoubledoubledoubleintgetSlot()intvoidsetAreaPerTest(double areaPerTest) voidsetClasses(List<DefectClass> classes) voidsetDefectDensity(double defectDensity) voidsetDefectFieldMap(Map<Integer, DefectRecordField> defectFieldMap) voidsetDefectRecordSpec(String defectRecordSpec) voidsetDefects(List<Defect> defects) voidsetDieOriginX(double dieOriginX) voidsetDieOriginY(double dieOriginY) voidsetDiePitchX(double diePitchX) voidsetDiePitchY(double diePitchY) voidsetFilename(String filename) voidsetFileTimestamp(LocalDateTime fileTimestamp) voidsetFileVersionMajor(int fileVersionMajor) voidsetFileVersionMinor(int fileVersionMinor) voidsetId(int id) voidsetInspectionStationIdPart1(String inspectionStationIdPart1) voidsetInspectionStationIdPart2(String inspectionStationIdPart2) voidsetInspectionStationIdPart3(String inspectionStationIdPart3) voidsetInspectionTest(int inspectionTest) voidvoidsetNumberOfDefectDies(int numberOfDefectDies) voidsetNumberOfDefects(int numberOfDefects) voidsetNumberOfDies(int numberOfDies) voidsetOrientationMarkLocation(OrientationMarkLocation orientationMarkLocation) voidsetResultTimestamp(LocalDateTime resultTimestamp) voidsetSampleCenterLocationX(double sampleCenterLocationX) voidsetSampleCenterLocationY(double sampleCenterLocationY) voidsetSampleOrientationMarkType(SampleOrientationMarkType sampleOrientationMarkType) voidsetSampleSize(double sampleSize) voidsetSampleTestPlan(List<SampleTest> sampleTestPlan) voidsetSampleType(SampleType sampleType) voidsetSetupIdName(String setupIdName) voidsetSetupIdTimestamp(LocalDateTime setupIdTimestamp) voidsetSlot(int slot) voidvoidsetSummarySpec(String summarySpec) voidsetTestNo(int testNo) voidsetWaferId(String waferId) voidsetWaferStatus(String waferStatus) toString()
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Constructor Details
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KLA
public KLA()
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Method Details
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getId
public int getId() -
setId
public void setId(int id) -
getFileVersionMajor
public int getFileVersionMajor() -
setFileVersionMajor
public void setFileVersionMajor(int fileVersionMajor) -
getFileVersionMinor
public int getFileVersionMinor() -
setFileVersionMinor
public void setFileVersionMinor(int fileVersionMinor) -
getFileTimestamp
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setFileTimestamp
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getInspectionStationIdPart1
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setInspectionStationIdPart1
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getInspectionStationIdPart2
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setInspectionStationIdPart2
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getInspectionStationIdPart3
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setInspectionStationIdPart3
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getSampleType
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setSampleType
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getResultTimestamp
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setResultTimestamp
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getLotID
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setLotID
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getSampleSize
public double getSampleSize() -
setSampleSize
public void setSampleSize(double sampleSize) -
getSetupIdName
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setSetupIdName
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getSetupIdTimestamp
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setSetupIdTimestamp
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getStepID
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setStepID
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getSampleOrientationMarkType
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setSampleOrientationMarkType
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getOrientationMarkLocation
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setOrientationMarkLocation
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getDiePitchX
public double getDiePitchX() -
setDiePitchX
public void setDiePitchX(double diePitchX) -
getDiePitchY
public double getDiePitchY() -
setDiePitchY
public void setDiePitchY(double diePitchY) -
getDieOriginX
public double getDieOriginX() -
setDieOriginX
public void setDieOriginX(double dieOriginX) -
getDieOriginY
public double getDieOriginY() -
setDieOriginY
public void setDieOriginY(double dieOriginY) -
getWaferId
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setWaferId
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getSlot
public int getSlot() -
setSlot
public void setSlot(int slot) -
getSampleCenterLocationX
public double getSampleCenterLocationX() -
setSampleCenterLocationX
public void setSampleCenterLocationX(double sampleCenterLocationX) -
getSampleCenterLocationY
public double getSampleCenterLocationY() -
setSampleCenterLocationY
public void setSampleCenterLocationY(double sampleCenterLocationY) -
getInspectionTest
public int getInspectionTest() -
setInspectionTest
public void setInspectionTest(int inspectionTest) -
getAreaPerTest
public double getAreaPerTest() -
setAreaPerTest
public void setAreaPerTest(double areaPerTest) -
getDefectRecordSpec
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setDefectRecordSpec
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getSummarySpec
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setSummarySpec
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getTestNo
public int getTestNo() -
setTestNo
public void setTestNo(int testNo) -
getNumberOfDefects
public int getNumberOfDefects() -
setNumberOfDefects
public void setNumberOfDefects(int numberOfDefects) -
getDefectDensity
public double getDefectDensity() -
setDefectDensity
public void setDefectDensity(double defectDensity) -
getNumberOfDies
public int getNumberOfDies() -
setNumberOfDies
public void setNumberOfDies(int numberOfDies) -
getNumberOfDefectDies
public int getNumberOfDefectDies() -
setNumberOfDefectDies
public void setNumberOfDefectDies(int numberOfDefectDies) -
getWaferStatus
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setWaferStatus
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getFilename
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setFilename
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getClasses
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setClasses
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getSampleTestPlan
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setSampleTestPlan
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getDefects
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setDefects
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getDies
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createDieMap
public void createDieMap() -
getMaxDefectsPerDie
public int getMaxDefectsPerDie() -
setDefectFieldMap
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toString
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